Jump to the main content block

Facilities

Equipment

Function: High-speed calculating server
Specification:
 Intel® Xeon® processor E5-2600 v4
 DDR4 Memory(24 DIMM slots).....
Function: Semiconductor Characterization Test
Specification:
 A general-purpose configuration for characterizing transistors and other devices
 Provides a four-SMU system with four Model 4225-PMUs that ......
Function: Low voltage high current supply
Specification:
 2,000W of pulsed power (±40V, ±50A)
 200W of DC power (±10V@±20A, ±20V@±10A,±40V@±5A).....
Function: Spectrum Two FTIR
Specification:
 Basic and advanced data manipulation routines
Spectral arithmetic calculations with custom......

Function: Stereoscopic image presentation of Component's Surface
Specification:
High resolution and large depth of field
20-2500 magnification....

Function:Thermal Image Analysis
Specification:
 Region emissivity correction
 Automatically calculate the total area of emissivity.....
Function:Integrated circuit reliability test
Specification:
 provides full suite of test applications – EM, SM, BTS, TDDB, SILC,MTTDDB, HCI, and BTI.
 A single system may run any mix of these applications simultaneously......
Function: battery cycling Test
Specification:
 High quality EIS Full scan
 from 10 kHz to 10 mHz....
Function: Element temperature and humidity Reliability Test
Specification:
 Temperature Range: -70°C to +190°C (-94°F to +375°F)
 Humidity Range: 10% to 98% relative humidity as limited by a +85°C (+185°F)..